Measurement and Test Technology

embeX develops and supplies automated test and inspection systems that are used in multiple ways: In preliminary investigations, during development, type testing and subsequent production. The platfom approach reduces costs significantly.

In addition, embeX develops test benches for the testing of components and systems under realistic conditions. To this end, we use a uniform platform, the embeX measurement platform MPL based on LabVIEW and TestStand, to enable efficient and flexible use. With the help of embeX MPL, we cover all phases of the product lifecycle with one platform: from use in pre-development and verification through to production and repair, after-sales and the development of product variants.

The hardware used in each phase is oriented to the individual requirements. The measurement and test programs each represent a subgroup of all available programs. This ensures highly efficient use of the measurement platform across products through vertical and horizontal integration. Due to our many years of experience in measurement and test technology, we can always tailor measurement and test systems based on a large platform to your individual requirements.

Automised Test Systems

The development of high-quality embedded systems requires extensive testing and trial. For this purpose, embeX relies on in-house developed automated test systems, based on our modular measurement platform embeX MPL. This enables efficient developments and simple extensions for individual projects. The basis of this platform is TestStand in combination with LabVIEW in order to guarantee a flexible and easily expandable overall system.

The following modules are integrated and implemented in our test systems:

  • Dynamic routing of measurement signals to measuring devices by means of a switching matrix
  • Acquisition and evaluation of dynamic, transient signals
  • Connection and control of test items via various buses (IO-Link, CAN, etc.)
  • Systematic evaluation of the acquired measurement data
  • Connection of the test specimen by means of a needle adapter
  • Boundary scan

In addition to the development and implementation of automatic test systems, we are also happy to support you in creating the necessary test strategies, test concepts and test specifications required for a sucessful verification.

Test Stands

In addition to automated test systems, embeX develops test benches for the testing of individual components or systems. Here we focus on endurance test benches or testing under special environmental conditions, for example. Due to our know-how in the field of testing technology, hardware-in-the-loop test benches are also part of our expertise. Here, too, embeX uses a modular framework to efficiently design data acquisition and data handling. This is particularly important for endurance tests due to the amount of data collected.

In-house Test Labs

embeX has laboratories and test benches on a total area of more than 800 m² with industrial trucks and gantry crane for positioning the test items weighing up to 1.6 t.

Environmental simulation

Passable alternating temperature chamber with humidification for environmental simulation and protection class testing:

  • Temperature: -40°C to +80°C
  • Relative humidity: 5% to 100%
  • Climate classes 3K3 - 3K7 according to EN 60721-3-3
  • Protection classes IPX3-IPX5 according to ISO 60529
  • Footprint: 4.9 m x 3.4 m, height: 3 m

EMC lab

embeX operates an own EMC lab for measurements according to the generic standards IEC 61000-x-y which accompany the development and for EMC debugging. The following measurements are carried out in-house with calibrated devices:

  • Burst according to IEC 61000-4-4 up to 5.5 kV
  • Surge according to IEC 61000-4-5 up to 5 kV
  • Conducted immunity according to IEC 61000-4-6
    • Frequency range: 150 kHz up to 230 MHz
  • Conducted emission according to CISPR 16-2-1
    • Frequency range: 150 kHz up to 30 MHz
  • Voltage dips and short interruptions
    • DC according to IEC 61000-4-29
    • AC according to IEC 61000-4-11
  • Emission in TEM cell according to CISPR 16-2-3
    • Frequency range: 30 MHz up to 1 GHz
  • Immunity in TEM cell according to IEC 61000-4-3
    • Field strength: Up to 12 V/m
    • Frequency range: 30 MHz up to 1 GHz
    • Test object size: Up to 450 x 300 x 200 mm3
  • ESD according to IEC 61000-4-2
    • Up to 8 kV contact discharge
    • Up to 15 kV air discharge

Test stand for energy storage systems

Regenerative DC source:

  • Characteristics: 1 V to 800 V, 200 A, 110 kW
  • Profiles for current, voltage and power 
  • Adjustment of internal resistance and capacity possible 
  • Simulation of batteries


Drive test benches

Individual and combination tests for the development and verification of electrical machines:

  • Power Pmax: approx. 90 kW
  • Torque Mmax: 780 Nm during motor operation and 920 Nm during generator operation, respectively
  • Speed nmax: 4098 rpm
  • Recording of M-n characteristics, current/voltage
  • Tracing of individual profiles

Combinations of frequency converter and motor according to the customer application are possible:

  • Power supply 400 VAC, 100 A
  • Variable mains AC up to 530 V, 45-65 Hz, 30 kW
  • Feed-in DC 800 V, 200 A, 110 kW for simulation of energy storages
  • Variable test object holder IEC size 112 to 225

HIL multi-axis test stands for endurance tests with up to six axes:

  • AC mains simulation
  • Variable DC supply
  • Direct coupling of ultracapacitors
  • Load side with up to 6 independent load machines
  • Simulation of load profiles and operating points
  • Characteristics: 3000 rpm, 94 Nm, 64 A

Tools

  • TestStand (National Instruments)
  • LabVIEW (National Instruments)
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